DocumentCode
1666862
Title
Modification of the optical properties of polydimethylsiloxane (PDMS) for photonic crystal biosensor application
Author
Rahong, Sakon ; Saekow, B. ; Porntheerapat, Suppanit ; Nukeaw, Jiti ; Hruanun, Chamdet ; Poyai, Amporn
Author_Institution
Nat. Nanotechnol. Center (NANOTEC), Nat. Sci. & Technol. Dev. Agency (NSTDA), Pathumthani, Thailand
fYear
2010
Firstpage
1303
Lastpage
1304
Abstract
The sensitivity of a photonic crystal optical biosensor device can be enhanced through the difference in effective refractive index of dielectric materials. In this work, we report the optical modification of refractive index of PDMS from 1.41 to above, by incorporating the additive materials to enhance the sensitivity of photonic crystal optical biosensor devices. The refractive index of mixed-PDMS materials are measured by ellipsometry technique. The surface and cross section morphologies are characterized by Field-Emission Scanning Electron Microscope (FESEM) and Atomic Force Microscope (AFM). The grating structure of 800 nm period PDMS with low refractive index was fabricated by Nano-Imprinting Lithography (NIL) then the mixed-PDMS with high refractive index was spun on the periodic PDMS as photonic crystal device. The sensitivity of devices is characterized and demonstrated by reflection spectra intensity of fluids on surface of the devices.
Keywords
atomic force microscopy; biosensors; ellipsometry; nanobiotechnology; nanolithography; optical sensors; photonic crystals; reflectivity; refractive index; scanning electron microscopy; soft lithography; AFM; FESEM; PDMS; atomic force microscope; dielectric materials; ellipsometry technique; field-emission scanning electron microscope; nanograting structure; nanoimprinting lithography; optical properties; photonic crystal biosensor; polydimethylsiloxane; refractive index; surface morphology; Atomic force microscopy; Biomedical optical imaging; Biosensors; Dielectric materials; Optical devices; Optical refraction; Optical sensors; Optical variables control; Photonic crystals; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-3543-2
Electronic_ISBN
978-1-4244-3544-9
Type
conf
DOI
10.1109/INEC.2010.5424894
Filename
5424894
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