• DocumentCode
    1667450
  • Title

    Surface modifications of organic buffer layer /inorganic dielectric in Zinc oxide transistors

  • Author

    Yang, Jin-Woo ; Kim, Jun-Ho ; Lee, Ho-Won ; Hyung, Gun-Woo ; Kim, Young Kwan

  • Author_Institution
    Dep. of Inf. Display, Hongik Univ., Seoul, South Korea
  • fYear
    2010
  • Firstpage
    1260
  • Lastpage
    1261
  • Abstract
    We report on the fabrication of top-contact ZnO field-effect transistors (FETs) with organic buffer dielectric on the inorganic dielectric. In flexible electronics, most inorganic semiconductors and dielectrics, including amorphous silicon, may be incompatible with temperature-sensitive plastic substrates. While organic semiconductors and organic dielectrics may seem well suited to this particular application niche. Therefore, in this paper, we show that ZnO-FETs using proven in organic semiconductor such as ZnO with organic buffer dielectric is a promising candidate of the flexible displays for flexible electronics, because ZnO-FETs can be fabricated at CPVA buffer dielectric layer with mobility (> 0.34 cm2/Vs) and on/off current ratio (> 4 × 106) at below 120°C.
  • Keywords
    II-VI semiconductors; buffer layers; dielectric materials; flexible displays; insulated gate field effect transistors; organic semiconductors; organic-inorganic hybrid materials; zinc compounds; ZnO; buffer dielectric layer; flexible displays; flexible electronics; inorganic dielectrics; inorganic semiconductors; organic buffer layer; organic dielectrics; organic semiconductors; surface modifications; top-contact field-effect transistors; zinc oxide transistors; Amorphous silicon; Buffer layers; Dielectric substrates; Displays; FETs; Fabrication; Flexible electronics; Organic semiconductors; Plastics; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424916
  • Filename
    5424916