• DocumentCode
    1667663
  • Title

    Effects of applied voltage on barrier oxide layer in porous AAO fabrication

  • Author

    Kim, Ji-Hong ; Jang, Sung Uk ; Park, Ki Hoon ; Kwon, Soon-Ju

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
  • fYear
    2010
  • Firstpage
    499
  • Lastpage
    500
  • Abstract
    Anodic aluminum oxide (AAO) with self-aligned nano-pores has fascinated researchers because of its potential application as an excellent template for nanotechnology. However the process to obtain long-range ordered pore structure is somewhat complicated, which hinders the full utilization of AAO. To make well-aligned porous AAO by hard anodizing (HA, ¿100V), one has to study more closely the controlling parameters of the barrier oxide layer thickness. On the basis of experimental results, a model for relation between external voltage and barrier layer thickness is suggested. The model has been derived through 3 steps. (1)The oxide growth rate is acquired from the oxidation current density combined with the `high field conduction´ model and the Faraday´s law. (2)Equation for dissolution rate of oxide is calculated from the Joule heating effect and heat of formation of Al2O3. (3)The relation between the barrier layer thickness and the voltage at the steady state is obtained by equating the growth and the dissolution rate of porous anodic oxide film. Finally, experimental results are fitted to the model and interpretation of various parameters in the model is given.
  • Keywords
    alumina; anodisation; current density; dissolving; long-range order; nanofabrication; nanoporous materials; oxidation; porosity; Al; Al2O3; Joule heating effect; barrier oxide layer thickness; current density; dissolution rate; external voltage; hard anodization; heat of formation; high field conduction model; long-range ordered pore structure; oxidation; porous anodic oxide film; self-aligned nanopores; Fabrication; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424925
  • Filename
    5424925