• DocumentCode
    1667703
  • Title

    A parallel technique for ATPG using genetic algorithms

  • Author

    Sabry, Mohamed ; Wahba, Ayman ; Mahdi, Hani

  • Author_Institution
    Dept. of Comput. & Syst. Eng., Ain Shams Univ., Cairo, Egypt
  • fYear
    1998
  • fDate
    6/20/1905 12:00:00 AM
  • Firstpage
    71
  • Abstract
    This paper presents a new technique for test pattern generation based on a genetic algorithm and parallel processing techniques. This new method offers compact test sets, compared to other methods, that achieve maximum coverage
  • Keywords
    automatic test pattern generation; genetic algorithms; integrated circuit testing; logic testing; parallel algorithms; ATPG; compact test sets; genetic algorithms; maximum coverage; parallel processing techniques; test pattern generation; Automatic test pattern generation; Biological cells; Circuit faults; Circuit testing; Genetic algorithms; Genetic engineering; Genetic mutations; Logic; Terminology; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 1998. ICM '98. Proceedings of the Tenth International Conference on
  • Conference_Location
    Monastir
  • Print_ISBN
    0-7803-4969-5
  • Type

    conf

  • DOI
    10.1109/ICM.1998.825571
  • Filename
    825571
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1667703