Electron emission mechanism of diamond characterised by combined XPS/UPS/FES

Author

Yamaguchi, H. ; Saito, I. ; Okamura, H. ; Yamada, T. ; Kudo, M. ; Pate, B.B. ; Okano, K.

Author_Institution

Dept. of Phys., Int. Christian Univ., Tokyo, Japan

fYear

2005

Firstpage

161

Lastpage

162

Abstract

In this paper, the electron emission characteristics of diamond was clarified using combined X-ray photoelectron spectroscopy (XPS)/ultraviolet photoelectron spectroscopy (UPS)/field emission spectroscopy (FES). Correlation between surface termination obtained by XPS, electron affinity estimated by UPS, and energy distribution of field emitted electron by FES, provided distinguished information on the origin of emitted electrons. The results showed that the field emitted electrons originated from the gap, approximately ∼ 1 eV above the valence band maximum (VBM).

Keywords

X-ray photoelectron spectra; diamond; electron affinity; electron field emission; ultraviolet photoelectron spectra; C; UPS; X-ray photoelectron spectroscopy; XPS; diamond; electron affinity; electron emission; energy distribution; field emission spectroscopy; surface termination; ultraviolet photoelectron spectroscopy; valence band maximum; Apertures; Cathodes; Electron emission; Energy measurement; Helium; Lighting; Nickel; Spectroscopy; Ultraviolet sources; Uninterruptible power systems;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International

Print_ISBN

0-7803-8397-4

Type

conf

DOI

10.1109/IVNC.2005.1619535

Filename

1619535