DocumentCode
1667885
Title
2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207)
fYear
2001
Abstract
The following topics were discussed: SOI materials technology; devices and device modelling; reliability; circuit applications
Keywords
semiconductor device models; semiconductor device reliability; silicon-on-insulator; SOI; circuit applications; device modelling; materials technology; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 2001 IEEE International
Conference_Location
Durango, CO, USA
ISSN
1078-621X
Print_ISBN
0-7803-6739-1
Type
conf
DOI
10.1109/SOIC.2001.957956
Filename
957956
Link To Document