A Test Generation Methodology for High-Performance Computer Chips and Modules

Author

Konemann, B. ; Noto, Phil

fYear

1992

Firstpage

826

Keywords

Automatic testing; Built-in self-test; Circuit testing; Clocks; Delay; Logic arrays; Logic testing; Packaging; Registers; Test equipment;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1992. Proceedings., International

ISSN

1089-3539

Print_ISBN

0-7803-0760-7

Type

DOI

10.1109/TEST.1992.527906

Filename

527906

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