• DocumentCode
    1670389
  • Title

    Characterization of nanostructured dendritic silver bismuth sulfide produced by solvothermal reactions

  • Author

    Thongtem, Titipun ; Tipcompor, Narongrit ; Thongtem, Somchai

  • Author_Institution
    Dept. of Chem., Chiang Mai Univ., Chiang Mai, Thailand
  • fYear
    2010
  • Firstpage
    1084
  • Lastpage
    1085
  • Abstract
    Nanoparticles and nanostructured dendritic silver bismuth sulfide were successfully produced from silver acetate, bismuth nitrate, and thiosemicarbarzide in ethylene glycol by 140-200°C solvothermal reactions for 24-72 h. The phase was detected using X-ray diffraction (XRD) and selected area electron diffraction (SAED). Their SAED patterns were also in accordance with those of the simulations. Scanning and transmission electron microscopies (SEM and TEM) revealed the nanostructured products. Their photoluminescence (PL) emissions were detected at the same wavelength of 380 and 420 nm, although they were produced under different conditions.
  • Keywords
    X-ray diffraction; bismuth compounds; crystal growth from solution; dendrites; electron diffraction crystallography; nanoparticles; photoluminescence; scanning electron microscopy; silver compounds; transmission electron microscopy; AgBiS2; X-ray diffraction; nanoparticles; nanostructured dendrite; photoluminescence; scanning electron microscopy; selected area electron diffraction; silver bismuth sulfide; solvothermal reaction; temperature 140 degC to 200 degC; time 24 h to 72 h; transmission electron microscopy; wavelength 380 nm; wavelength 420 nm; Anti-freeze; Bismuth; Nanoparticles; Phase detection; Scanning electron microscopy; Silver; X-ray detection; X-ray detectors; X-ray diffraction; X-ray scattering; Luminescence; Nanostructured dendrites; Silver bismuth sulfide; Solvothermal reaction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5425026
  • Filename
    5425026