• DocumentCode
    1670501
  • Title

    Improving Total IC Design Quality using Application Mode Testing

  • Author

    Mehtani, R. ; deJonghe, M. ; Morren, R. ; Baker, K.

  • fYear
    1992
  • Firstpage
    866
  • Keywords
    Animation; Application specific integrated circuits; Data engineering; Design engineering; Digital signal processing; Integrated circuit testing; Laboratories; Process design; System testing; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527912
  • Filename
    527912
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1670501