• DocumentCode
    1671146
  • Title

    Non-conventional faults in BiCMOS digital circuits

  • Author

    Ma, Siyad C. ; McCluskey, Edward J.

  • fYear
    1995
  • Firstpage
    882
  • Keywords
    BiCMOS integrated circuits; Bipolar transistors; CMOS logic circuits; Circuit faults; Circuit simulation; Circuit testing; Delay; Digital circuits; Fault diagnosis; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527914
  • Filename
    527914
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1671146