Effects of errors in the resistive taper on the farfield scattering patterns of strips

Resistive tapers that lower the sidelobes of or place nulls in the scattering patterns of strips have practical limitations. The authors examine the effects of random errors in the resistive taper on the induced current densities in the strip and the resulting errors in the scattering patterns. Random errors in the low-sidelobe resistive taper are shown to cause predictable errors in the induced strip current density and RCS (radar cross section). The large errors in resistivity also occur where the strip current density is smallest, thus mitigating their effects.<>