DocumentCode
1671870
Title
Session 18 overview - high-speed interconnects and building blocks
Author
Gutnik, Vadim ; Green, Michael
fYear
2005
Firstpage
326
Lastpage
327
Keywords
BiCMOS integrated circuits; CMOS process; CMOS technology; Circuit testing; Equalizers; Finite impulse response filter; Integrated circuit interconnections; Monitoring; Optical buffering; Optical fibers;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2005. Digest of Technical Papers. ISSCC. 2005 IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
0-7803-8904-2
Type
conf
DOI
10.1109/ISSCC.2005.1494001
Filename
1494001
Link To Document