DocumentCode
1672586
Title
The Design of RFID Testing Channel Based on Direct Digital Synthesis Chip
Author
Ying-Zheng, Hong ; Wei, Chen
Author_Institution
Minist. of Public Security Shanghai, Shanghai
fYear
2007
Firstpage
1067
Lastpage
1069
Abstract
In recent years, radio frequency identification (RFID) technology has been widely used in many fields. Thus, how to reduce the price of testing RFID chip become a key problem which must be considered by chip manufacturer and test equipment supplier now. As an important part of carrier generator, direct digital synthesis chip play a key role in RFID testing system. In the paper, a new and economical design of RFID testing channel based on direct digital synthesis chip is discussed.
Keywords
direct digital synthesis; integrated circuit testing; radiofrequency identification; system-on-chip; RFID chip testing; RFID testing channel; carrier generator; direct digital synthesis chip; radio frequency identification; Automatic testing; Circuit testing; Clocks; Fires; Frequency shift keying; Frequency synthesizers; PROM; Radiofrequency identification; Signal synthesis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems, 2007. ICCCAS 2007. International Conference on
Conference_Location
Kokura
Print_ISBN
978-1-4244-1473-4
Type
conf
DOI
10.1109/ICCCAS.2007.4348230
Filename
4348230
Link To Document