Multilevel approach for the investigation of substrate parasitics in mixed-signal IC´s from full-wave analysis

Author

Wane, S. ; Bajon, D. ; Baudrand, H. ; Gamand, P.

Author_Institution

ENSEEIHT, Toulouse, France

fYear

2003

Firstpage

263

Lastpage

266

Abstract

This paper presents an original Multilevel approach of Substrate Parasitics in Mixed-Signal IC\´s from full-wave analysis based on a Transverse Waves Formulation. The concept of layout "approximation" is introduced to analyse the effects of "details" at different scales on the global coupling between pads. Realistic examples of typical BiCMOS structures are presented and results obtained by a home-made EM simulator are successfully compared to published measurements and to those of Moment Method approaches (SONNET Software). An original patterned grounded shield is proposed and demonstrates high isolation capability in presence of buried epitaxial layers.

Keywords

BiCMOS integrated circuits; integrated circuit modelling; method of moments; mixed analogue-digital integrated circuits; BiCMOS structure; EM simulator; SONNET software; buried epitaxial layer; full-wave analysis; isolation technology; layout approximation; mixed-signal IC; moment method; multilevel model; patterned grounded shield; substrate parasitics; transverse waves formulation; BiCMOS integrated circuits; Boundary conditions; Circuit noise; Circuit simulation; Dielectric substrates; Epitaxial layers; Integral equations; Metallization; Moment methods; Wavelet analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 IEEE

ISSN

1529-2517

Print_ISBN

0-7803-7694-3

Type

conf

DOI

10.1109/RFIC.2003.1213940

Filename

1213940