• DocumentCode
    1674019
  • Title

    Area compact 5T portless SRAM cell for high density cache in 65nm CMOS

  • Author

    Yadav, Jitendra Kumar ; Das, Pallavi ; Jain, Abhinav ; Grover, Anuj

  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    High performance SOC contains considerable amount of SRAM memory occupying more than 60% of total SOC area. In CMOS process scaling down of feature size enables higher density and lower cost but high density array has significant impact on manufacturing yield and performance parameters of conventional 6T SRAM cell. In this paper we have presented an alternate area compact 5 transistor portless SRAM cell in 65nm CMOS technology. Various performance and reliability issues of 5T cell have been addressed. This 5T cell has shown to have 20-30% area reduction without any significant performance degradation as compared to the conventional 6T SRAM cell.
  • Keywords
    CMOS memory circuits; SRAM chips; integrated circuit reliability; CMOS process; area compact 5T portless SRAM cell; high density cache; manufacturing yield; size 65 nm; Computer architecture; Layout; Microprocessors; SRAM cells; System-on-chip; Transistors; 5T SRAM cell; low area; portless SRAM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design and Test (VDAT), 2015 19th International Symposium on
  • Conference_Location
    Ahmedabad
  • Print_ISBN
    978-1-4799-1742-6
  • Type

    conf

  • DOI
    10.1109/ISVDAT.2015.7208095
  • Filename
    7208095