• DocumentCode
    1677959
  • Title

    Reduced phase noise of a varactor tunable oscillator: numerical calculations and experimental results

  • Author

    Gungerich, V. ; Zinkler, F. ; Anzill, W. ; Russer, P.

  • Author_Institution
    Lehrstuhl fuer Hochfrequenztech., Tech. Univ., Munchen, Germany
  • fYear
    1993
  • Firstpage
    561
  • Abstract
    The signal and phase noise properties of two planar integrated tunable GaAs-MESFET oscillators with different resonator circuits at the gate terminal of the transistor are investigated using nonlinear calculation methods. The phase noise is calculated in the time domain by perturbation methods. The single sideband phase noise of a varactor-tunable microwave oscillator is reduced significantly to a value of -95 dBc/Hz, at an offset frequency of 100 kHz using a coupled microstrip line at the gate terminal of the transistor for determining the oscillation frequency. The measured output power of the oscillator is bout 12 dBm. In spite of the higher quality factor of this resonator circuit compared to that of a single microstrip line, a tuning bandwidth of more than 20% is achieved.<>
  • Keywords
    III-V semiconductors; MMIC; field effect integrated circuits; gallium arsenide; microstrip components; microwave oscillators; noise; nonlinear network analysis; time-domain analysis; varactors; variable-frequency oscillators; GaAs; coupled microstrip line; nonlinear calculation methods; output power; perturbation methods; phase noise properties; planar integrated tunable GaAs-MESFET oscillators; quality factor; resonator circuits; single sideband phase noise; time domain; tuning bandwidth; varactor-tunable microwave oscillator; Coupling circuits; Frequency; Microstrip; Microwave oscillators; Microwave transistors; Perturbation methods; Phase noise; Power measurement; Tunable circuits and devices; Varactors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1993., IEEE MTT-S International
  • Conference_Location
    Atlanta, GA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1209-0
  • Type

    conf

  • DOI
    10.1109/MWSYM.1993.276876
  • Filename
    276876