• DocumentCode
    1679380
  • Title

    Low Cost Test of High Bandwidth Embedded Memories

  • Author

    Gorman, Kevin W. ; Anand, Darren ; Pomichter, Gary ; Corbin, William R.

  • Author_Institution
    IBM Syst. & Technol. Group, Essex Junction, VT
  • fYear
    2006
  • Firstpage
    445
  • Lastpage
    448
  • Abstract
    This work presents architectures and methods necessary for providing efficient and thorough test of high bandwidth embedded memories using low speed ATE. Details are also provided on the techniques used to minimize test related silicon area and test time requirements. This combination of flexible at-speed test with minimal circuitry and ATE requirements, and reduced time under test, leads to lower cost production of embedded memories
  • Keywords
    DRAM chips; automatic test equipment; built-in self test; embedded systems; DRAM chips; automatic test equipment; built-in self test; embedded memories; Bandwidth; Built-in self-test; Circuit testing; Clocks; Costs; Logic testing; Random access memory; Silicon; System testing; Tiles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    1-4244-0075-9
  • Electronic_ISBN
    1-4244-0076-7
  • Type

    conf

  • DOI
    10.1109/CICC.2006.320820
  • Filename
    4114998
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1679380