DocumentCode
1679531
Title
Frequency-Based Measurement of Mismatches Between Small Capacitors
Author
Verma, Ashutosh ; Razavi, Behzad
Author_Institution
Dept. of Electr. Eng., California Univ., Los Angeles, CA
fYear
2006
Firstpage
481
Lastpage
484
Abstract
The mismatch between two capacitors can be measured by alternately switching each into an oscillator and measuring the change in the oscillation frequency. Three-stage differential ring oscillators can provide multiple mismatch data points for capacitances as small as 8 fF. Experimental results obtained from test circuits fabricated in 0.13-mum CMOS technology also reveal lower mismatches for metal sandwich capacitors than for lateral fringe structures
Keywords
CMOS integrated circuits; capacitors; frequency measurement; oscillators; 0.13 micron; CMOS technology; differential ring oscillators; frequency-based measurement; lateral fringe structures; metal sandwich capacitors; oscillation frequency; small capacitors; CMOS technology; Capacitance measurement; Circuit testing; Electric variables measurement; Frequency measurement; Noise measurement; Oscillators; Semiconductor device noise; Switched capacitor circuits; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Conference_Location
San Jose, CA
Print_ISBN
1-4244-0075-9
Electronic_ISBN
1-4244-0076-7
Type
conf
DOI
10.1109/CICC.2006.320861
Filename
4115005
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