• DocumentCode
    1679709
  • Title

    A 1.8-V 22-mW 10-bit 30-MS/s Subsampling Pipelined CMOS ADC

  • Author

    Li, Jian ; Zeng, Xiaoyang ; Xie, Lei ; Chen, Jun ; Zhang, Jianyun ; Guo, Yawei

  • Author_Institution
    State Key Lab of ASIC & Syst., Fudan Univ., Shanghai
  • fYear
    2006
  • Firstpage
    513
  • Lastpage
    516
  • Abstract
    This paper describes a 10-bit 30-MS/s subsampling pipelined ADC that is implemented in a 0.18 mum CMOS process. The ADC adopts a power efficient amplifier sharing architecture in which a set of switches is introduced to reduce the influence between the two opamp-sharing successive stages. A new configuration is used in the first stage of the ADC to avoid using a dedicated sample-and-hold amplifier (SHA) circuit at the input and to avoid the matching requirement between the first multiplying digital-to-analog converter (MDAC) and flash input signal paths, which is very strict in a traditional SHA-less architecture. The measured differential and integral nonlinearities of the prototype show less than 0.57 least significant bit (LSB) and 0.8 LSB respectively at full sampling rate. The ADC exhibits higher than 9.1 effective number of bits (ENOB) for input frequencies up to 30 MHz, which is the twofold Nyquist rate (fs/2), at 30 MS/s. The ADC consumes 21.6 mW from a 1.8-V supply and occupies 0.7 mm2, which also includes the bandgap and buffer amplifiers
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; buffer circuits; operational amplifiers; pipeline processing; sample and hold circuits; 0.18 micron; 1.8 V; 10 bit; 22 mW; 30 MHz; CMOS technology; Nyquist rate; analog-digital converters; bandgap amplifiers; buffer amplifiers; operational amplifiers; pipelined ADC; sample-and-hold amplifiers; Apertures; CMOS process; Circuits; Digital video broadcasting; Digital-analog conversion; Pipelines; Power amplifiers; Power dissipation; Sampling methods; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    1-4244-0075-9
  • Electronic_ISBN
    1-4244-0076-7
  • Type

    conf

  • DOI
    10.1109/CICC.2006.320895
  • Filename
    4115012