• DocumentCode
    1681548
  • Title

    Characteristics of indium oxide films prepared by DC magnetron sputtering

  • Author

    Axelevitch, A. ; Rabinovitch, E. ; Golan, G.

  • Author_Institution
    Center for Technol. Educ., Holon, Israel
  • fYear
    1996
  • Firstpage
    448
  • Lastpage
    451
  • Abstract
    Highly conductive transparent indium oxide (In2O3 ) thin films were prepared by DC magnetron sputtering using pure indium oxide targets. Sputtering was done in a pure Argon (Ar) atmosphere with a residual pressure of less than 4× 10-5 Torr. The substrate temperature was varied during the sputtering process from room temperature to 250°C. Some of the In 2O3 samples were given a post-deposition heat treatment while still in vacuum. The indium oxide films were deposited on borosilicate glass plates 0.13±0.17 mm thick and on optical slide glasses 1 mm thick. The resultants films were characterized for their optical, electrical and mechanical properties. Results show that films with resistivity as low as 2.7×10-3 Ωcm, and transmittance as high as 92% in the visible range (400±650 nm) can be obtained by gaining a complete control on the process parameters. A variance in the electrical, mechanical and optical properties of the In2O3 films was found in layers made on borosilicate glass substrates
  • Keywords
    electrical resistivity; heat treatment; indium compounds; optical films; semiconductor growth; semiconductor materials; semiconductor thin films; sputtered coatings; transparency; visible spectra; 400 to 650 nm; DC magnetron sputtering; In2O3; borosilicate glass plate; conductive transparent film; electrical properties; heat treatment; indium oxide; mechanical properties; optical properties; optical slide glass; resistivity; visible transmittance; Argon; Atmosphere; Conductive films; Glass; Heat treatment; Indium; Mechanical factors; Optical films; Sputtering; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Electronics Engineers in Israel, 1996., Nineteenth Convention of
  • Conference_Location
    Jerusalem
  • Print_ISBN
    0-7803-3330-6
  • Type

    conf

  • DOI
    10.1109/EEIS.1996.567012
  • Filename
    567012