• DocumentCode
    1681731
  • Title

    A sense amplifier based circuit for concurrent detection of soft and timing errors in CMOS ICs

  • Author

    Tsiatouhas, Y. ; Matakias, S. ; Arapoyanni, A. ; Haniotakis, Th

  • Author_Institution
    Comput. Sci. Dept., Ioannina Univ., Greece
  • fYear
    2003
  • Firstpage
    12
  • Lastpage
    16
  • Abstract
    We propose a new concurrent soft and timing error detection circuit that exploits the time redundancy approach to achieve tolerance with respect to transient and delay faults. The idea is based on current mode sense amplifier topologies to provide fast error detection times.
  • Keywords
    CMOS integrated circuits; amplifiers; concurrent engineering; error detection; integrated circuit testing; redundancy; timing circuits; CMOS IC; concurrent detection; current mode sense amplifier topologies; delay faults tolerance; error detection; monitoring circuit; sense amplifier based circuit; soft error; time redundancy approach; timing errors; transient error tolerance; Circuit faults; Circuit testing; Clocks; Computer errors; Costs; Delay; Electrical fault detection; Frequency; Redundancy; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
  • Print_ISBN
    0-7695-1968-7
  • Type

    conf

  • DOI
    10.1109/OLT.2003.1214360
  • Filename
    1214360
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1681731