• DocumentCode
    16821
  • Title

    Signal-Integrity Optimization for Complicated Multiple-Input Multiple-Output Networks Based on Data Mining of S-Parameters

  • Author

    Mu-Shui Zhang ; Hong-Zhou Tan ; Jun-Fa Mao

  • Author_Institution
    Dept. of Electron. & Commun. Eng., Sun Yat-sen Univ., Guangzhou, China
  • Volume
    4
  • Issue
    7
  • fYear
    2014
  • fDate
    Jul-14
  • Firstpage
    1184
  • Lastpage
    1192
  • Abstract
    In this paper, an efficient signal-integrity analysis and optimization method for complicated multiple-input multiple-output (MIMO) networks is proposed, in which data mining is applied to discover the concealed information in black-box S-parameter models. Instead of performing a number of circuit simulations, data mining employs mathematical search algorithm directly into the model, which can save significant analyzed time and improve the efficiency. An optimized mining flow is presented for large scale data set, where the data processing and data mining are performed simultaneously, and thus it is unnecessary to save large extracted data. The proposed data mining method consider both the interconnect structure and the stimulated pattern of a MIMO system, which can perform thoughtful analysis and optimization with high efficiency. Two examples, signal-integrity analysis of two coupled microstrip lines and noise coupling among multiple signal vias through a power-ground plane pair, are presented to demonstrate the efficiency of the proposed data mining method in signal-integrity optimization design.
  • Keywords
    MIMO systems; S-parameters; circuit optimisation; circuit simulation; data mining; microstrip lines; MIMO networks; MIMO system; black-box S-parameter models; coupled microstrip lines; data mining; interconnect structure; mathematical search algorithm; multiple-input multiple-output networks; noise coupling; power-ground plane pair; signal integrity analysis; signal integrity optimization design; simultaneous switching noise; Couplings; Data mining; Integrated circuit interconnections; Integrated circuit modeling; MIMO; Noise; Scattering parameters; Data mining; S-parameter; signal integrity; simultaneous switching noise (SSN); simultaneous switching noise (SSN).;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2014.2306957
  • Filename
    6755486