DocumentCode
1682127
Title
Probe tip invasiveness at indirect electro-optic sampling of MMIC
Author
Mertin, W. ; Roths, C. ; Taenzler, F. ; Kubalek, E.
Author_Institution
Duisburg Univ., Germany
fYear
1993
Firstpage
1351
Abstract
Electric field disturbances induced by an electrooptic (EO) probe tip have been experimentally investigated up to 40 GHz by means of direct EO sampling. The results are compared with conventional network analyzer measurements. A field distortion depending on the working distance between the EO probe tip and the tested circuit, which has to be taken into account when using this technique for MMIC (monolithic microwave integrated circuit) characterization above 30 GHz, is shown.<>
Keywords
MMIC; electro-optical devices; integrated circuit testing; measurement by laser beam; microwave measurement; probes; 40 GHz; MMIC; electric field disturbances; field distortion; indirect electro-optic sampling; monolithic microwave integrated circuit; probe tip invasiveness; Circuit testing; Distortion measurement; Integrated circuit measurements; Integrated circuit testing; MMICs; Microwave integrated circuits; Microwave theory and techniques; Monolithic integrated circuits; Probes; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location
Atlanta, GA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1209-0
Type
conf
DOI
10.1109/MWSYM.1993.277127
Filename
277127
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