• DocumentCode
    1686741
  • Title

    Improving software reliability and productivity via mining program source code

  • Author

    Xie, Tao ; Acharya, Mithun ; Thummalapenta, Suresh ; Taneja, Kunal

  • Author_Institution
    Dept. of Comput. Sci., North Carolina State Univ., Raleigh, NC
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A software system interacts with third-party libraries through various APIs. Insufficient documentation and constant refactorings of third-party libraries make API library reuse difficult and error prone. Using these library APIs often needs to follow certain usage patterns. These patterns aid developers in addressing commonly faced programming problems such as what checks should precede or follow API calls, how to use a given set of APIs for a given task, or what API method sequence should be used to obtain one object from another. Ordering rules (specifications) also exist between APIs, and these rules govern the secure and robust operation of the system using these APIs. These patterns and rules may not be well documented by the API developers. Furthermore, usage patterns and specifications might change with library refactorings, requiring changes in the software that reuse the library. To address these issues, we develop novel techniques (and their supporting tools) based on mining source code, assisting developers in productively reusing third party libraries to build reliable and secure software.
  • Keywords
    application program interfaces; software development management; software libraries; software reliability; API library reuse; program source code mining; secure software; software productivity; software reliability; software system; third-party library; Computer errors; Computer science; Data mining; Documentation; Productivity; Programming; Robustness; Software libraries; Software reliability; Software systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel and Distributed Processing, 2008. IPDPS 2008. IEEE International Symposium on
  • Conference_Location
    Miami, FL
  • ISSN
    1530-2075
  • Print_ISBN
    978-1-4244-1693-6
  • Electronic_ISBN
    1530-2075
  • Type

    conf

  • DOI
    10.1109/IPDPS.2008.4536384
  • Filename
    4536384