DocumentCode
1689530
Title
Test strategies for a family of complex MCMs
Author
Flint, Andrew
Author_Institution
Logic & Analog Technol. Group, Motorola Inc., Tempe, AZ, USA
fYear
34608
Firstpage
436
Lastpage
445
Abstract
The development of MCM test practices from chip and board test practices is summarized. The general philosophy behind MCM test strategy selection is given. A family of complex MCMs providing computer system building blocks is described. The design features related to testability and test coverage are detailed. Then, test strategies developed for each MCM are related, with emphasis on the improvements in fault coverage and diagnostic resolution provided by attention to design-for-testability
Keywords
computer testing; fault location; integrated circuit testing; integrated memory circuits; multichip modules; printed circuit testing; board test; chip test; complex MCM; computer interface; design; design-for-testability; diagnostic resolution; fault coverage; nonvolatile memory; test coverage; testability; volatile memory; Automatic logic units; Automatic test pattern generation; Circuit faults; Circuit testing; Design for testability; Fault diagnosis; Integrated circuit testing; Logic testing; Packaging; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.527985
Filename
527985
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