DocumentCode
1691832
Title
Package warpage evaluation for multi-layer molded PQFP
Author
Kiang, Bill ; Wittmershaus, Janice ; Kar, Rudra ; Sugai, Neil
Author_Institution
Intel Corp., Chandler, AZ, USA
fYear
1991
Firstpage
89
Lastpage
93
Abstract
Finite element analyses (FEAs) together with molding experimentation with various mold chases were conducted to evaluate the mechanisms for package warpage and leadframe deflection of multi-layer PQFP (plastic quad flat pack) packages. The leadframe downset structure is identified as the major factor contributing to the package warpage. It is demonstrated that package warpage can be eliminated by properly tailoring the top and bottom mold cavity depths. The post mold cure, which raises the T g of the molding compound, also helps reduce the package warpage. FEA calculations of package warpage at room temperature are in good agreement with experimental data. The leadframe deflection is also due primarily to its downset structure and may be reduced by preheating the leadframe before the encapsulation
Keywords
VLSI; encapsulation; finite element analysis; packaging; surface mount technology; FEA calculations; encapsulation; experimental data; fine pitch PQFP; finite element analysis; leadframe deflection; leadframe downset structure; leadframe preheating; mold cavity depths; mold chases; molding experimentation; multi-layer PQFP; multilayer PQFP; package warpage; plastic quad flat pack; post mold cure; room temperature; Components, packaging, and manufacturing technology; Cooling; Costs; Electronics packaging; Finite element methods; Land surface temperature; Material properties; Plastic packaging; Resins; Surface-mount technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Manufacturing Technology Symposium, 1991., Eleventh IEEE/CHMT International
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-0155-2
Type
conf
DOI
10.1109/IEMT.1991.279753
Filename
279753
Link To Document