• DocumentCode
    1691904
  • Title

    Research on the automatic visual inspection model based on extenics

  • Author

    Ding, F.-H. ; Lin, M.-X. ; De Wu ; Li, D.-W.

  • Author_Institution
    Key Lab. of High Efficiency & Clean Mech. Manuf., Shandong Univ., Jinan, China
  • fYear
    2010
  • Firstpage
    6037
  • Lastpage
    6041
  • Abstract
    This paper puts forward five-layer extension AVI model (EAVI) by combining the extension knowledge and automatic visual inspection(AVI)area knowledge. Then gives the detailed analysis process of the image acquisition layer and pre-processing layer according to the four extension thinking modes, and designs the AVI model evaluating methods. Describing and analyzing the AVI process using the methods provided by Extenics will be helpful to the research on the intelligence, generality, and the reconfigurability of the AVI system.
  • Keywords
    computer vision; data acquisition; AVI; Extenics; automatic visual inspection model; image acquisition layer; Artificial intelligence; Inspection; Silicon; Silicon compounds; Solid modeling; Video recording; Visualization; automatic visiual inspection; extenics; extension assessment; five-layer model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Automation (WCICA), 2010 8th World Congress on
  • Conference_Location
    Jinan
  • Print_ISBN
    978-1-4244-6712-9
  • Type

    conf

  • DOI
    10.1109/WCICA.2010.5554614
  • Filename
    5554614