• DocumentCode
    1693043
  • Title

    Modeling of performance-related design trade-offs in multi-chip assemblies

  • Author

    Palusinski, Olgierd A. ; Hohl, Jakob H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
  • fYear
    1991
  • Firstpage
    333
  • Lastpage
    336
  • Abstract
    The authors discuss the need for development of global performance measures for multi-chip microelectronic assemblies and systems. In particular, electrical performance measures of memory assemblies and their dependence on design parameters were studied. Models of pertinent components of electronic systems, such as off-chip drivers and receivers, and chip-to-chip signal transmission lines were used to evaluate essential properties of memory modules. The read access time was selected as a measure of performance of those modules. Using simple modeling this measure is related to basic parameters such as conductor geometry, substrate material thickness and permittivity, I/O pitch in chip carriers and chip access time. The specific memory module considered shows strong dependence of performance measure on materials used in its construction. The relationships between systems performance, materials properties, and geometry are described by analytic approximations; however, more accurate modeling will use look-up tables and specialized computer programs. Development of suitable computer support for system design based on developed models of performance is discussed
  • Keywords
    modelling; modules; packaging; semiconductor storage; I/O pitch; MCM; chip access time; chip carriers; chip-to-chip signal transmission lines; computer support; conductor geometry; design parameters; global performance measures; memory assemblies; microelectronic assemblies; modeling; multi-chip assemblies; performance-related design tradeoffs; permittivity; read access time; substrate material thickness; Assembly systems; Conducting materials; Electric variables measurement; Microelectronics; Particle measurements; Permittivity measurement; Semiconductor device measurement; Solid modeling; Time measurement; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1991., Eleventh IEEE/CHMT International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-0155-2
  • Type

    conf

  • DOI
    10.1109/IEMT.1991.279808
  • Filename
    279808