• DocumentCode
    1693214
  • Title

    Polyquinoline coatings and films: improved organic dielectrics for IC´s and MCM´s

  • Author

    Hendricks, Neil H. ; Hsu, L.C. ; Taran, Carmen ; Marrocco, Matthew L.

  • Author_Institution
    Maxdem Inc., San Dimas, CA, USA
  • fYear
    1991
  • Firstpage
    361
  • Lastpage
    365
  • Abstract
    It is pointed out that polymers intended for use in electronics applications must meet a diverse set of stringent requirements on their mechanical, physical, chemical, and electronic properties. New polyquinolines, developed at Maxdem, possess outstanding properties across the board, making them ideal candidates for applications in the electronics industry. These polymers are characterized by excellent thermal and oxidative stability, very low moisture absorption and very low dielectric constant. One member of the family of polyquinolines, PQ-100, is currently under evaluation for use as an interlayer dielectric in high density interconnect applications, including multichip modules. PQ-100 can be cast into free standing films or spin coated to form high-quality coatings on silicon or other surfaces. Films of PQ-100 display a very low thermal expansion coefficient, and extremely low residual stress on silicon substrates. PQ-100 outperforms polyimides in these and other areas critical to high speed, high density packaging
  • Keywords
    dielectric thin films; integrated circuit technology; packaging; polymer films; IC technology; Maxdem; PQ-100; Si substrate; free standing films; high density interconnect applications; high density packaging; high speed packaging; high-quality coatings; interlayer dielectric; low dielectric constant; low moisture absorption; low residual stress; low thermal expansion coefficient; multichip modules; organic dielectrics; oxidative stability; polymers; polyquinolines; spin coated; thermal stability; Chemicals; Coatings; Dielectric films; Dielectric substrates; Electronics industry; Mechanical factors; Polymers; Semiconductor films; Silicon; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1991., Eleventh IEEE/CHMT International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-0155-2
  • Type

    conf

  • DOI
    10.1109/IEMT.1991.279815
  • Filename
    279815