• DocumentCode
    1693637
  • Title

    Reusing Component Test Cases for Integration Testing of Retarding Embedded System Components

  • Author

    Pérez, Abel Marrero ; Kaiser, Stefan

  • Author_Institution
    Daimler Center for Automotive IT Innovations, Tech. Univ. Berlin, Berlin, Germany
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The integration of retarding components represents a crucial challenge for reusing component test cases for integration testing. Failing to synchronize both test stimulation and test evaluation easily results in useless test executions missing the actual test objectives. We propose a method for balancing and compensating delays for multi-level test cases. With this approach, reusing component test cases for integration testing becomes possible even in presence of components introducing large delays. It represents a better alternative to test case parameterization.
  • Keywords
    embedded systems; object-oriented programming; program testing; software reusability; component test case reusage; delay balancing; delay compensation; embedded system component integration testing; Automatic control; Automatic testing; Automotive engineering; Delay; Electronic equipment testing; Embedded software; Embedded system; Life testing; Software testing; System testing; Embedded Systems; Test Case Reuse; Test Event Synchronization; Test Levels;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in System Testing and Validation Lifecycle, 2009. VALID '09. First International Conference on
  • Conference_Location
    Porto
  • Print_ISBN
    978-1-4244-4862-3
  • Electronic_ISBN
    978-0-7695-3774-0
  • Type

    conf

  • DOI
    10.1109/VALID.2009.19
  • Filename
    5280015