• DocumentCode
    1693707
  • Title

    Package characterization and development of a flip chip QFN package: fcMLF

  • Author

    McCann, David R. ; Ha, SunHo

  • Author_Institution
    Amkor Technol., Chandler, AZ, USA
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    365
  • Lastpage
    371
  • Abstract
    Describes the performance of a low cost molded package using flip chip interconnections on a copper lead frame substrate. Two flip chip interconnect metallurgies were evaluated: High Pb bumps attached to the lead frame using eutectic Sn37Pb solder paste; Au bumps attached to the leadframe using eutectic Sn3.5Ag solder paste. This package format is identified as the flip chip MicroLeadframe (fcMLF) package family (QFN) in this presentation. Temperature cycle, HAST, storage, and MRT testing were performed. All reliability requirements were achieved. Level 1 260°C J-STD-020A moisture classification was achieved. This fcMLF package was also evaluated with and without an exposed thermal pad. Electrical model simulations were completed showing the package was applicable for use up to 40 GHz, depending upon die to package size ratio. Thermal models were completed that demonstrated thermal dissipation of 35°C/W theta JA for a 4.00 × 4.00 mm body size with an exposed pad.
  • Keywords
    flip-chip devices; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; integrated circuit reliability; moisture; moulding; 260 degC; 4.00 mm; 40 GHz; Au; Au bumps; HAST; MRT testing; Pb; body size; die to package size ratio; electrical model simulations; exposed pad; exposed thermal pad; flip chip MicroLeadframe; flip chip QFN package; high Pb bumps; interconnect metallurgies; low cost molded package; moisture classification; package characterization; package format; reliability requirements; solder paste; storage; temperature cycle; thermal dissipation; thermal models; Copper; Costs; Flip chip; Gold; Lead; Moisture; Packaging; Performance evaluation; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008122
  • Filename
    1008122