• DocumentCode
    1694630
  • Title

    Micro-crack detection of multicrystalline solar cells featuring shape analysis and support vector machines

  • Author

    Anwar, S.A. ; Abdullah, M.Z.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Univ. Sains Malaysia, Nibong Tebal, Malaysia
  • fYear
    2012
  • Firstpage
    143
  • Lastpage
    148
  • Abstract
    This paper presents a strategy for detecting micro-crack in the multicrystalline solar cells. This detection goal is very challenging because micro-crack defects occur inside the cell and can only be visualized with the technique such as electroluminescence (EL) procedure. EL images of solar cell are segmented and analyzed by means of advanced image segmentation technique and shape analysis. The output from these procedures is the dataset of shape features that represent crack and non-crack pixels. The classification of the shapes is achieved by the implementation of the artificial classifier based on the support vector machines (SVM). A number of SVM algorithms are considered in this study to address the issues of the non-linear separation and the imbalanced samples between classes in the dataset. The result indicates that the SVM with penalty parameter weighting is more accurate, resulting in the sensitivity, specificity and accuracy of 91.8% 97.2 % and 97.0 % respectively.
  • Keywords
    crack detection; electroluminescence; image classification; image segmentation; microcracks; power engineering computing; solar cells; support vector machines; EL images; EL procedure; SVM algorithms; artificial classifier; electroluminescence procedure; image segmentation technique; microcrack defects; microcrack detection; multicrystalline solar cells; nonlinear separation; penalty parameter weighting; shape analysis; shape classification; support vector machines; Solar cells; image segmentation; micro-crack; shape analysis; support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control System, Computing and Engineering (ICCSCE), 2012 IEEE International Conference on
  • Conference_Location
    Penang
  • Print_ISBN
    978-1-4673-3142-5
  • Type

    conf

  • DOI
    10.1109/ICCSCE.2012.6487131
  • Filename
    6487131