• DocumentCode
    1696097
  • Title

    Noise analysis and characterization of a sigma-delta capacitive silicon microaccelerometer

  • Author

    Kulah, H. ; Junseok Chae ; Najafi, K.

  • Author_Institution
    Center for Wireless Integrated Microsyst., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    1
  • fYear
    2003
  • Firstpage
    95
  • Abstract
    This paper reports a high-sensitivity low-noise capacitive accelerometer system with one micro-g//spl radic/Hz resolution. The system operates as a 2/sup nd/-order electromechanical /spl Sigma/-/spl Delta/ modulator together with the interface electronics. A detailed noise analysis of electromechanical /spl Sigma/-/spl Delta/ capacitive accelerometers with a final goal of achieving sub-/spl mu/g resolution is also presented. The circuit has more than 120 dB dynamic range and can resolve better than 10 aF. The complete module operates from a single 5V supply and has a measured sensitivity of 960 mV/g with a noise floor of 1.08 /spl mu/g//spl radic/Hz in open-loop. This system can resolve better than 10 /spl mu/g//spl radic/Hz in closed-loop.
  • Keywords
    accelerometers; capacitors; elemental semiconductors; microsensors; semiconductor device noise; silicon; 120 dB; 5 V; Si; interface electronics; microresolution; noise analysis; second order electromechanical modulator; sensitivity; sigma delta capacitive silicon microaccelerometer; 1f noise; Accelerometers; Capacitive sensors; Circuit noise; Delta-sigma modulation; Dynamic range; Electrodes; Parasitic capacitance; Silicon; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-7731-1
  • Type

    conf

  • DOI
    10.1109/SENSOR.2003.1215261
  • Filename
    1215261