DocumentCode
1697600
Title
Integration of design, manufacturing and testing
Author
Maly, W.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
34608
Firstpage
1017
Abstract
Traditionally, the majority of testing methodologies have been based on the application of ever more powerful testers-designed acid fabricated to test ever faster and more complex ICs. Such a product-driven and tester-focused testing paradigm has been on one hand technically successful but on the other hand has fueled a dramatic increase in testing costs. Hence, the question: “is it possible to increase testers´ performance maintaining at the same time testing costs on an acceptable level?” seems to be a key in predicting the future of IC testing
Keywords
design for manufacture; design for testability; integrated circuit testing; IC testing; VLSI; complex IC; design; product-driven testing; testing costs; Circuit testing; Controllability; Costs; Electronic equipment testing; Hardware; Integrated circuit testing; Manufacturing; Observability; Semiconductor device testing; Size measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.528051
Filename
528051
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