DocumentCode
1697755
Title
Observations on the 1149.x family of standards
Author
Parker, Kenneth P.
Author_Institution
Manuf. Test Div., Hewlett-Packard Co., Loveland, CO, USA
fYear
34608
Firstpage
1023
Abstract
Five years of experience with the IEEE 1149.1 standard are discussed. It has been widely accepted across the electronics industry. It has made major contributions to board level testability. However, the advancement of the 1149.1 standard has not been as rapid as one might have imagined and there are some outstanding problems that it does not well address. As a member of the 1149.1 and P1149.4 working groups, as well as a developer of software for ATE systems, the author is interested in what one can learn from the 1149 and discusses his experiences in this field
Keywords
IEEE standards; automatic test equipment; automatic testing; boundary scan testing; integrated circuit testing; ATE; CMOS testing; IEEE 1149.1 standard; IEEE 1149.1 working group; P1149.4 working groups; SAMPLE behavior; board level testability; boundary scan testing; electronics industry; Circuit synthesis; Circuit testing; Design engineering; Electronic design automation and methodology; Manufacturing; Process design; Proposals; Silicon; Software systems; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.528057
Filename
528057
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