DocumentCode
1699660
Title
Perceptual dissimilarity metric: A full reference objective image quality measure to quantify the degradation of perceptual image quality
Author
Saha, Simanto ; Tahtali, Murat ; Lambert, Andrew ; Pickering, Mark
Author_Institution
Sch. of Eng. & Inf. Technol., Univ. of New South Wales, Canberra, ACT, Australia
fYear
2013
Abstract
This paper introduces a full reference objective image quality measure to quantify the degradation of perceptual image quality. Objective methods for assessing perceptual image quality are important for many image processing applications, such as monitoring and controlling image quality for quality control systems, benchmarking image processing systems and so on. The novel image quality metric proposed in this paper uses a relatively small number of pair-wise intensity comparisons to represent a patch as binary string, then compares corresponding patches using Hamming distances. It then calculates a dissimilarity value between images as an average of the Hamming distances computed between patches. The proposed metric is more consistent with human visual system and thus outperforms other existing and widely used metrics, namely the root mean square error (RMSE) and structural similarity index (SSIM). The computational cost of the proposed metric is also less compared to the state-of-the-art method.
Keywords
Gaussian processes; image processing; quality control; Hamming distances; RMSE; SSIM; binary string; full reference objective image quality measure; human visual system; image processing applications; image quality control; image quality metric; image quality monitoring; perceptual dissimilarity metric; perceptual image quality degradation; quality control systems; root mean square error; structural similarity index; Australia; Educational institutions; Handheld computers; Indexes; Measurement; Observers; RMSE; SSIM; image quality metric; objective image quality measure;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing and Information Technology(ISSPIT), 2013 IEEE International Symposium on
Conference_Location
Athens
Type
conf
DOI
10.1109/ISSPIT.2013.6781902
Filename
6781902
Link To Document