• DocumentCode
    1700269
  • Title

    Microsystems for the fabrication of nano-scale structures

  • Author

    Courcimault, C.G. ; Kercher, D.S. ; Allen, M.G.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    1
  • fYear
    2003
  • Firstpage
    730
  • Abstract
    This paper describes fabrication and testing of microsystems which can be utilized for in-situ deposition control and direct patterning of structures with micron and submicron lateral and vertical dimensions. An electrostatically-driven microactuator acts as an addressable active shutter and shadow mask in a Physical Vapor Deposition system. The displacement of the actuator is controlled in the nano-scale range, without using electrical sensing circuitry, by means of ´stoppers´ fabricated as integral parts of the structure. The deposition of metals through the real-time-actuated microsystem allowed control of the three dimensional shape of the deposited patterns as verified by AFM measurements.
  • Keywords
    atomic force microscopy; electrostatic actuators; masks; nanostructured materials; nanotechnology; plasma CVD; thin films; AFM; addressable active shutter; electrostatically-driven microactuator; microsystems testing; nanoscale structures; physical vapor deposition; real-time-actuated microsystem; shadow mask; structures direct patterning; submicron lateral dimensions; submicron vertical dimensions; three dimensional shape control; Actuators; Chemical vapor deposition; Circuits; Displacement control; Fabrication; Microactuators; Nanostructures; Shape control; Shape measurement; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-7731-1
  • Type

    conf

  • DOI
    10.1109/SENSOR.2003.1215577
  • Filename
    1215577