DocumentCode
1701497
Title
Modeling of passive elements and reliability
Author
Gildenblat, Gennady ; Onodera, Hidetoshi
Author_Institution
Arizona State University, USA
fYear
2009
Firstpage
1
Lastpage
2
Abstract
Rapid growth of RF CMOS applications makes it necessary to develop accurate models of passive circuit elements such as inductors and resistors. Given the complexity of the integrated circuit passive elements and the increased demands for the compact models accuracy, development of the compact models of inductors and resistors becomes an interesting and challenging research area. The reliability modeling has remained an important task since the days of the first integrated circuits. Continued scaling of the state of the art integrated circuit technology accompanied by the reduced margins for error demands the increasing accuracy of the reliability modeling.
Keywords
CMOS process; Circuit testing; Circuit topology; Delay; Frequency measurement; Inverters; MOS devices; Ring oscillators; Spatial resolution; Tiles;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
Conference_Location
San Jose, CA, USA
Print_ISBN
978-1-4244-4071-9
Electronic_ISBN
978-1-4244-4073-3
Type
conf
DOI
10.1109/CICC.2009.5280810
Filename
5280810
Link To Document