• DocumentCode
    1701497
  • Title

    Modeling of passive elements and reliability

  • Author

    Gildenblat, Gennady ; Onodera, Hidetoshi

  • Author_Institution
    Arizona State University, USA
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Rapid growth of RF CMOS applications makes it necessary to develop accurate models of passive circuit elements such as inductors and resistors. Given the complexity of the integrated circuit passive elements and the increased demands for the compact models accuracy, development of the compact models of inductors and resistors becomes an interesting and challenging research area. The reliability modeling has remained an important task since the days of the first integrated circuits. Continued scaling of the state of the art integrated circuit technology accompanied by the reduced margins for error demands the increasing accuracy of the reliability modeling.
  • Keywords
    CMOS process; Circuit testing; Circuit topology; Delay; Frequency measurement; Inverters; MOS devices; Ring oscillators; Spatial resolution; Tiles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    978-1-4244-4071-9
  • Electronic_ISBN
    978-1-4244-4073-3
  • Type

    conf

  • DOI
    10.1109/CICC.2009.5280810
  • Filename
    5280810