Characterization of room temperature detectors using the proposed IEEE standard

The availability and quality of room temperature detectors such as cadmium-zinc-telluride (CZT) has improved in recent years. There are many applications for these, but at present there are inconsistencies among manufacturers and users in the methods of testing and describing them. To overcome this deficiency, a standard is being developed similar to the ones that apply to NaI, HPGe and other detectors. The standard will describe methods of measuring efficiency, resolution and noise, and will provide details of the test apparatus necessary to perform the tests. It will also take into account the differences between the newer semiconductor detectors and those developed earlier. It furnishes definitions for specialized terms. Tutorial material is included.