• DocumentCode
    1702806
  • Title

    A novel voltage measurement approach for image reconstruction of Electrical impedance tomography

  • Author

    Luo, Ciyong ; Chen, Minyou ; Wang, Ping ; He, Wei

  • Author_Institution
    State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Electr. Eng. of Chongqing Univ., Chongqing
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Noise is inherent to any real imaging system. In this paper, a new voltage measurement approach, called blend measure pattern, is developed to deal with anti-noise problem in electrical impedance tomography. The paper adopts a single current source, applies electrical currents to the body using a pair of adjacent electrodes. Different from the conventional adjacent voltage measure pattern, the proposed blend measure pattern improves system signal-to-noise ratio through selecting the larger cross measure voltage signal and discarding the smaller signal. Comparative study on the adjacent and blend measure patterns employing the fast Newtonpsilas one step error reconstructor (FNOSER) algorithm to the resolution of electrical impedance tomography has been conducted. The approach was validated with lab experiments. The results show that the proposed measure pattern has good anti-noise capability that dramatically reduces the dynamic change of measured electrode voltages, and produces clear image with less artificial inhomogeneities, compared to the adjacent measure pattern.
  • Keywords
    electric current measurement; electric impedance imaging; electrodes; image reconstruction; voltage measurement; antinoise problem; blend measure pattern; cross measure voltage signal; electrical current; electrical impedance tomography; electrode; image reconstruction; imaging system; one step error reconstructor; signal-to-noise ratio; voltage measurement; Conductivity measurement; Current measurement; Electric variables measurement; Electrodes; Image reconstruction; Impedance measurement; Noise measurement; Signal to noise ratio; Tomography; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Congress, 2008. WAC 2008. World
  • Conference_Location
    Hawaii, HI
  • Print_ISBN
    978-1-889335-38-4
  • Electronic_ISBN
    978-1-889335-37-7
  • Type

    conf

  • Filename
    4699296