DocumentCode
1702806
Title
A novel voltage measurement approach for image reconstruction of Electrical impedance tomography
Author
Luo, Ciyong ; Chen, Minyou ; Wang, Ping ; He, Wei
Author_Institution
State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Electr. Eng. of Chongqing Univ., Chongqing
fYear
2008
Firstpage
1
Lastpage
4
Abstract
Noise is inherent to any real imaging system. In this paper, a new voltage measurement approach, called blend measure pattern, is developed to deal with anti-noise problem in electrical impedance tomography. The paper adopts a single current source, applies electrical currents to the body using a pair of adjacent electrodes. Different from the conventional adjacent voltage measure pattern, the proposed blend measure pattern improves system signal-to-noise ratio through selecting the larger cross measure voltage signal and discarding the smaller signal. Comparative study on the adjacent and blend measure patterns employing the fast Newtonpsilas one step error reconstructor (FNOSER) algorithm to the resolution of electrical impedance tomography has been conducted. The approach was validated with lab experiments. The results show that the proposed measure pattern has good anti-noise capability that dramatically reduces the dynamic change of measured electrode voltages, and produces clear image with less artificial inhomogeneities, compared to the adjacent measure pattern.
Keywords
electric current measurement; electric impedance imaging; electrodes; image reconstruction; voltage measurement; antinoise problem; blend measure pattern; cross measure voltage signal; electrical current; electrical impedance tomography; electrode; image reconstruction; imaging system; one step error reconstructor; signal-to-noise ratio; voltage measurement; Conductivity measurement; Current measurement; Electric variables measurement; Electrodes; Image reconstruction; Impedance measurement; Noise measurement; Signal to noise ratio; Tomography; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation Congress, 2008. WAC 2008. World
Conference_Location
Hawaii, HI
Print_ISBN
978-1-889335-38-4
Electronic_ISBN
978-1-889335-37-7
Type
conf
Filename
4699296
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