Innovative approach of V and Z analysis for mix signal transceiver failure

This paper introduces the approach of V and Z analysis in solving the transceiver failure for the mix-signal product. It describes the methodology derived from the understanding of low voltage differential signal (LVDS) design at input/output (I/O) buffer. While conventional method of current/voltage (I/V) parametric analysis shows only the diode characteristic, the V and Z analysis is initiated to reveal the key parameters inside the LVDS design of the transceiver. This approach proved its feasibility for the failure analysis/fault isolation (FA/FI) that is sensitive to the fluctuation of voltage and impedance parameters.