• DocumentCode
    1702953
  • Title

    Split capacitor DAC mismatch calibration in successive approximation ADC

  • Author

    Chen, Yanfei ; Zhu, Xiaolei ; Tamura, Hirotaka ; Kibune, Masaya ; Tomita, Yasumoto ; Hamada, Takayuki ; Yoshioka, Masato ; Ishikawa, Kiyoshi ; Takayama, Takeshi ; Ogawa, Junji ; Tsukamoto, Sanroku ; Kuroda, Tadahiro

  • Author_Institution
    Keio Univ., Yokohama, Japan
  • fYear
    2009
  • Firstpage
    279
  • Lastpage
    282
  • Abstract
    A split capacitor DAC calibration method is proposed that a bridge capacitor larger than conventional design allows a tunable capacitor to compensate for mismatch. To guarantee proper calibration, a comparator with digital timing control offset cancellation is proposed. An 8-bit successive approximation ADC with 4b+4b split capacitor DAC calibration has been implemented in 65 nm CMOS, achieving 0.3LSB DNL and INL with 180fF input capacitance.
  • Keywords
    analogue-digital conversion; calibration; capacitors; digital-analogue conversion; bridge capacitor; digital timing control offset cancellation; guarantee proper calibration; split capacitor DAC mismatch calibration; tunable capacitor; Bridge circuits; Calibration; Capacitance; Capacitors; Digital control; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-4071-9
  • Electronic_ISBN
    978-1-4244-4073-3
  • Type

    conf

  • DOI
    10.1109/CICC.2009.5280859
  • Filename
    5280859