• DocumentCode
    1712350
  • Title

    A reliability comparison of lead free and Eutectic solder for stencil printing based flip-chip applications

  • Author

    Yau, Esther W C ; Gong, J.F. ; Hong, Benny F W ; Chan, Philip C.H.

  • Author_Institution
    Hong Kong University of Science and Technology
  • fYear
    2003
  • Firstpage
    323
  • Lastpage
    330
  • Keywords
    Circuit testing; Electronic waste; Environmentally friendly manufacturing techniques; Gold; Inspection; Lead; Printing; Reliability engineering; Temperature; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2003. Proceedings. 53rd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7791-5
  • Type

    conf

  • DOI
    10.1109/ECTC.2003.1216297
  • Filename
    1216297