• DocumentCode
    1712889
  • Title

    Research on millimeter-wave image denoising method based on contourlet and compressed sensing

  • Author

    Han, Bo ; Xiong, Jintao ; Li, Liangchao ; Yang, Jianyu ; Wang, Zhimin

  • Author_Institution
    Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    2
  • fYear
    2010
  • Abstract
    In this paper, we analyze the general properties of passive millimeter-wave (PMMW) imaging system, then the denoising principle of contourlet and compressed sensing is briefly described. With both denoising advantages of contourlet and compressed sensing, a PMMW image denoising algorithm is designed. And, in the process of compressed sensing denoising, a new type of observation matrix, which is called amplitude-matching variable density measurement matrix, is proposed utilizing the priority information of low-pass property of system. Experiments demonstrate that this improvement can eliminate the “scratches” parts which the contourlet denosing produces. PSNR of image is enhanced and subjective visual feeling of millimeter-wave image is obviously improved.
  • Keywords
    image coding; image denoising; matrix algebra; millimetre wave imaging; PMMW image denoising algorithm; PMMW imaging system; amplitude-matching variable density measurement matrix; compressed sensing denoising; contourlet denosing; contourlet sensing; denoising advantages; denoising principle; low-pass property; millimeter-wave image denoising method; observation matrix; passive millimeter-wave imaging system; Compressed sensing; Imaging; Millimeter wave technology; Noise; Noise reduction; Signal processing algorithms; Transforms; amplitude-matching variable density measurement matrix; compressed sensing denoising; contourlet denoising; passive millimeter-wave image;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Processing Systems (ICSPS), 2010 2nd International Conference on
  • Conference_Location
    Dalian
  • Print_ISBN
    978-1-4244-6892-8
  • Electronic_ISBN
    978-1-4244-6893-5
  • Type

    conf

  • DOI
    10.1109/ICSPS.2010.5555429
  • Filename
    5555429