• DocumentCode
    171351
  • Title

    Terahertz detection using on chip patch and dipole antenna-coupled GaAs High Electron Mobility Transistors

  • Author

    Nahar, Shamsun ; Gutin, A. ; Muraviev, A. ; Wilke, Ingrid ; Shur, M. ; Hella, Mona M.

  • Author_Institution
    Dept. of Electr., Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2014
  • fDate
    1-6 June 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents high responsivity plasmonic terahertz (THz) power detectors operating at 0.3 THz. The detectors are implemented using 130 nm depletion mode InGaAs/GaAs pseudomorphic High Electron Mobility Transistors (pHEMT) with on chip patch and dipole antennas connected to the gate terminal. The measured absolute responsivity at room temperature is 7V/W, while the normalized responsivity with respect to the THz beam and physical antenna area is 8kV/W, with a noise equivalent power (NEP) of 9.1 pW/√(Hz). The paper also addresses the bias dependency of the signal to noise ratio (SNR), THz detector input impedance and the matching requirement for the connection between the antenna and input to the gate of the THz detector.
  • Keywords
    III-V semiconductors; dipole antennas; gallium arsenide; high electron mobility transistors; indium compounds; terahertz wave detectors; InGaAs-GaAs; SNR; THz beam; THz detector input impedance; bias dependency; dipole antenna-coupled high electron mobility transistors; frequency 0.3 THz; gate terminal; high responsivity plasmonic terahertz power detectors; measured absolute responsivity; on chip patch; pHEMT; pHEMT depletion mode; pseudomorphic high electron mobility transistors; signal to noise ratio; size 130 nm; temperature 293 K to 298 K; terahertz detection; Antenna measurements; Detectors; Dipole antennas; Lenses; Noise; Optical variables measurement; Wires; GaAs technology; Plasmonic THz detector; THz imaging; dipole antenna; patch antenna;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium (IMS), 2014 IEEE MTT-S International
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/MWSYM.2014.6848475
  • Filename
    6848475