DocumentCode
1716617
Title
3D self-assembling of SU-8 microstructures on silicon by plasma induced compressive stress
Author
Bureau, Jean-Baptiste ; Legrand, Bernard ; Collard, Dominique ; Buchaillot, Lionel
Author_Institution
ISEN Dept., IEMN CNRS UMR 8520, France
Volume
1
fYear
2005
Firstpage
19
Abstract
This paper presents the development of suspended movable microstructures made of SU-8 photoresist where compressive stress leads to 3D self-assembled microstructures. Internal compressive stress in the photoresist is induced by an SF6 based plasma process. Clamped-clamped beam structures have been fabricated to characterize the stress depending on the plasma duration and the lengths of the beams. A compressive stress of 48 MPa was calculated for a 3 minute plasma. X-ray photoelectron spectroscopy (XPS) analysis has been performed to characterize the surface of the structures. These mechanical properties could be used to make 3D self-assembled structures for applications in biological sciences.
Keywords
X-ray spectroscopy; micromechanical devices; photoresists; self-assembly; silicon; 3D self-assembling; SF6; SF6 based plasma process; SU-8 microstructures; SU-8 photoresist; X-ray photoelectron spectroscopy; biological sciences; clamped-clamped beam structures; plasma induced compressive stress; silicon; suspended movable microstructures; Compressive stress; Microstructure; Particle beams; Performance analysis; Plasma applications; Plasma properties; Plasma x-ray sources; Resists; Silicon; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN
0-7803-8994-8
Type
conf
DOI
10.1109/SENSOR.2005.1496348
Filename
1496348
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