DocumentCode
1717604
Title
Degradation factors for eye diagrams using FDTD/SPICE
Author
Orhanovic, Neven ; Divekar, Dileep ; Matsui, Norio
Author_Institution
Applied Simulation Technology
fYear
2003
Firstpage
1602
Lastpage
1607
Keywords
Circuit simulation; Crosstalk; Degradation; Digital systems; Finite difference methods; Integrated circuit interconnections; SPICE; Scattering parameters; Signal analysis; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
ISSN
0569-5503
Print_ISBN
0-7803-7791-5
Type
conf
DOI
10.1109/ECTC.2003.1216513
Filename
1216513
Link To Document