DocumentCode
1717998
Title
Electrical derivative analysis of leakage current in quantum cascade lasers
Author
Guo, Dingkai ; Choa, Fow-Sen ; Cheng, Liwei ; Chen, Xing ; Godbole, Mohit
Author_Institution
Dept. of Comput. Sci. & Electr. Eng., Univ. of Maryland, Baltimore, MD
fYear
2009
Firstpage
276
Lastpage
277
Abstract
Leakage current in quantum-cascade-lasers with oxide-blocked-ridge waveguide and buried-heterostructure (with/without n-InP top-cover) are compared using electrical derivative measurements. Oxide-blocking structure provides the least leakage current although the top-covered BH QCLs show the toughest durability.
Keywords
III-V semiconductors; indium compounds; leakage currents; quantum cascade lasers; ridge waveguides; semiconductor lasers; InP; QCL; durability; leakage current; oxide-blocked-ridge waveguide; quantum cascade lasers; Computer science; Current measurement; Electric variables measurement; Indium phosphide; Leakage current; Light sources; Pulse measurements; Quantum cascade lasers; Quantum computing; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide & Related Materials, 2009. IPRM '09. IEEE International Conference on
Conference_Location
Newport Beach, CA
ISSN
1092-8669
Print_ISBN
978-1-4244-3432-9
Electronic_ISBN
1092-8669
Type
conf
DOI
10.1109/ICIPRM.2009.5012512
Filename
5012512
Link To Document