• DocumentCode
    1718065
  • Title

    Test-structure free modeling method for de-embedding the effects of pads on device modeling

  • Author

    Cha, Cheolung ; Huang, Zhaoran ; Jokerst, Nan M. ; Brooke, Martin A.

  • Author_Institution
    Georgia Institute of Technology
  • fYear
    2003
  • Firstpage
    1694
  • Lastpage
    1700
  • Keywords
    Atherosclerosis; Calibration; Circuit synthesis; Circuit testing; Electrical resistance measurement; Equivalent circuits; Integrated circuit interconnections; Microelectronics; Probes; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2003. Proceedings. 53rd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7791-5
  • Type

    conf

  • DOI
    10.1109/ECTC.2003.1216530
  • Filename
    1216530
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1718065