DocumentCode
1719366
Title
Resolution Test Technique and Influencing Factors Analysis of a Low-background Anti-Compton HPGe γ-ray Spectrometer
Author
Chunlin, Zhou ; Zhenhua, Xu ; Congxue, Xu
Author_Institution
Xi´´an Res. Inst. of Hi-Tech., Xi´´an
fYear
2007
Abstract
This paper tests the resolutions under different high voltages, electronics and source´s position of a low-background anti-Compton HPGe gamma-ray spectrometer. The experimental results show that these factors have important influence on resolution. It is experimentally confirmed that the spectrometer can reaches at the best resolution of 1.77 keV at a high voltage of 3250 V under the condition of suited electronics and proper position of the source.
Keywords
gamma-ray spectrometers; HPGe gamma-ray spectrometer; anti-Compton spectrometer; electron volt energy 1.77 keV; influencing factors analysis; resolution test technique; voltage 3250 V; Electronic equipment testing; Electrons; Gas detectors; Instruments; Manufacturing; Nuclear electronics; Plugs; Spectroscopy; Steel; Voltage; HPGe ¿ -ray spectrometer; Influencing Factors; Resolution Test;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-1136-8
Electronic_ISBN
978-1-4244-1136-8
Type
conf
DOI
10.1109/ICEMI.2007.4350514
Filename
4350514
Link To Document